12 bit 30 MSPS逐次比较型ADC的测试

杨云帆; 赵雷; 周圣智; 刘建峰; 刘树彬; 安琪

doi:10.11804/NuclPhysRev.35.01.046

原子核物理评论

12 bit 30 MSPS逐次比较型ADC的测试

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杨云帆, 赵雷, 周圣智, 刘建峰, 刘树彬, 安琪. 2018: 12 bit 30 MSPS逐次比较型ADC的测试, 原子核物理评论, 35(1): 46-52. doi: 10.11804/NuclPhysRev.35.01.046

引用本文:

杨云帆, 赵雷, 周圣智, 刘建峰, 刘树彬, 安琪. 2018: 12 bit 30 MSPS逐次比较型ADC的测试, 原子核物理评论, 35(1): 46-52. doi: 10.11804/NuclPhysRev.35.01.046

YANG Yunfan, ZHAO Lei, ZHOU Shengzhi, LIU Jianfeng, LIU Shubin, AN Qi. 2018: Testing of a 12 bit 30 MSPS SAR ADC, Nuclear Physics Review, 35(1): 46-52. doi: 10.11804/NuclPhysRev.35.01.046

Citation:

YANG Yunfan, ZHAO Lei, ZHOU Shengzhi, LIU Jianfeng, LIU Shubin, AN Qi. 2018: Testing of a 12 bit 30 MSPS SAR ADC, Nuclear Physics Review, 35(1): 46-52. doi: 10.11804/NuclPhysRev.35.01.046

12 bit 30 MSPS逐次比较型ADC的测试

核探测与核电子学国家重点实验室,中国科学技术大学,合肥230026;中国科学技术大学近代物理系,合肥230026

Testing of a 12 bit 30 MSPS SAR ADC

摘要: 针对物理实验读出的需求设计了一款低功耗12 bit 30 MSPS逐次比较型模数变换器(Analog-to-Digital Converter,ADC)芯片,为评估其性能指标参数,需进行系统的测试.在本研究工作中构建了测试系统,然后按照IEEE标准进行了系统的测试和分析.测试结果表明,输入信号在基带范围内ADC有效位(Effective Number Of Bit,ENOB)约为9 bit,达到了本版本芯片的设计指标.同时,综合分析静态性能与动态性能测试结果,可以通过优化逐次比较型ADC中电容阵列电容失配参数,进一步提升ADC的非线性指标,为下一版芯片的改进设计提供了参考依据.
- 模数转换器 /
- 逐次比较 /
- 动态性能测试 /
- 静态性能测试
Abstract: Aiming at the requirement of readout electronics in physics experiments,a 12 bit 30 MSPS successiveapproximation-register (SAR) analog-to-digital converter (ADC) with low power consumption has been designed.To evaluate the performance of this ASIC,we conducted a series of tests.We set up a test system,and we tested the ADC according to IEEE std 1241-2010.The test results indicate that the effective number of bit (ENOB) of the ADC is around 9 bits when the input signal is in the first Nyquist zone,which has met the design requirements.According to the results of dynamic and static tests of this ADC,we found that the non-linearity performance of this ASIC can be further enhanced by improving the mismatching among the capacitor array,and this provides important information for the design of the second version of this ADC.

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12 bit 30 MSPS逐次比较型ADC的测试

核探测与核电子学国家重点实验室,中国科学技术大学,合肥230026;中国科学技术大学近代物理系,合肥230026

关键词:

摘要: 针对物理实验读出的需求设计了一款低功耗12 bit 30 MSPS逐次比较型模数变换器(Analog-to-Digital Converter,ADC)芯片,为评估其性能指标参数,需进行系统的测试.在本研究工作中构建了测试系统,然后按照IEEE标准进行了系统的测试和分析.测试结果表明,输入信号在基带范围内ADC有效位(Effective Number Of Bit,ENOB)约为9 bit,达到了本版本芯片的设计指标.同时,综合分析静态性能与动态性能测试结果,可以通过优化逐次比较型ADC中电容阵列电容失配参数,进一步提升ADC的非线性指标,为下一版芯片的改进设计提供了参考依据.

English Abstract

Testing of a 12 bit 30 MSPS SAR ADC

核探测与核电子学国家重点实验室,中国科学技术大学,合肥230026;中国科学技术大学近代物理系,合肥230026

Keywords:

Abstract: Aiming at the requirement of readout electronics in physics experiments,a 12 bit 30 MSPS successiveapproximation-register (SAR) analog-to-digital converter (ADC) with low power consumption has been designed.To evaluate the performance of this ASIC,we conducted a series of tests.We set up a test system,and we tested the ADC according to IEEE std 1241-2010.The test results indicate that the effective number of bit (ENOB) of the ADC is around 9 bits when the input signal is in the first Nyquist zone,which has met the design requirements.According to the results of dynamic and static tests of this ADC,we found that the non-linearity performance of this ASIC can be further enhanced by improving the mismatching among the capacitor array,and this provides important information for the design of the second version of this ADC.

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12 bit 30 MSPS逐次比较型ADC的测试

Testing of a 12 bit 30 MSPS SAR ADC

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12 bit 30 MSPS逐次比较型ADC的测试

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Testing of a 12 bit 30 MSPS SAR ADC

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