随机散射屏的原子力显微镜形貌分析及其光散射特性
MORPHOLOGICAL ANALYSIS BY ATOMIC FORCE MICROSCOPE AND LIGHT SCATTERING STUDY FOR RANDOM SCATTERING SCREENS
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引用本文: | 亓东平, 刘德丽, 滕树云, 张宁玉, 程传福. 2000: 随机散射屏的原子力显微镜形貌分析及其光散射特性, 物理学报, 49(7): 1260-1266. doi: 10.3321/j.issn:1000-3290.2000.07.010 |
Citation: | QI DONG-PING, LIU DE-LI, TENG SHU-YUN, ZHANG NING-YU, CHENG CHUAN-FU. 2000: MORPHOLOGICAL ANALYSIS BY ATOMIC FORCE MICROSCOPE AND LIGHT SCATTERING STUDY FOR RANDOM SCATTERING SCREENS, Acta Physica Sinica, 49(7): 1260-1266. doi: 10.3321/j.issn:1000-3290.2000.07.010 |