摘要:
电光相位调制器是光纤通信系统、微波光子系统和相干光通信系统中的关键器件之一。作为器件本征参数，电光相位调制器的半波电压通常利用光谱方法和电谱方法进行测量。光谱方法受到光源线宽和光谱仪分辨率限制，测量的分辨率较低；电谱方法则需要光电检测之前将相位调制转换成强度调制，电谱方法的主要困难在于需要对探测器的不平坦响应进行额外校准。提出了利用双音外差实现电光相位调制器半波电压自校准测量新方法，该方法利用双音电光相位调制的边带与移频光载波的外差拍频，对外差拍频信号进行频谱分析，获得电光相位调制器的半波电压；通过设定双音调制信号的频率关系，克服了探测器光电转换中的不平坦频率响应，实现了自校准测量。该方法可扩展探测器和频谱仪的测试频率两倍以上，节省至少一半的带宽需求。与光谱测量方法相比，该方法测试分辨率大幅提高且避免了光源线宽的影响；与传统电域测量方法相比，该方法无需额外校准，无驱动功率和工作波长限制，且对测试仪器带宽需求降低一半以上。实验证实了所提方法获得的电光相位调制器半波电压的测量结果与光谱分析法获得的结果一致，且大幅度地提高了测量范围和分辨率。该方法提供了非常简单的电光相位调制器微波特性化分析方法，对其他光电子器件分析也提供了参考。
Abstract:
High speed electrooptic phase modulators play very important roles in the high-speed optical fiber communication system, microwave photonic system, and coherent optical communication system, due to their advantages of bias voltage free and linear modulation. As an intrinsic parameter, the half-wave voltage of an electrooptic phase modulator has been characterized by using an electrical spectrum method and an optical spectrum method in the last two decades. The op-tical spectrum method is generally limited by the line-width of the laser source and the resolution of the available optical spectrum analyzer, while the electrical spectrum method requires the conversion from phase modulation to intensity modulation before photodetection, since a phase modulator generates a phase modulated optical signal with constant envelope. The major di?culty in the electrical spectrum method lies in the extra calibration for the responsivity fluctu-ation in the photodetection. In this paper, a novel self-calibrated measurement of half-wave voltage of electrooptic phase modulators is carried out based on the optical heterodyning between the two-tone phase modulated sidebands and the frequency-shifted carrier. The method achieves a self-calibration measurement, and avoids the effect of the responsivity fluctuation in the photodetection by setting a specific frequency relationship between the two-tone microwave signals. Moreover, it extends the measuring frequency range to the double bandwidth of photodetection and spectrum analysis. Compared with the optical spectrum method, the proposed method achieves very high frequency resolution measure-ment, and simultaneously avoids the line-width influence of laser source by use of two-tone heterodyning. Compared with the traditional electrical spectrum method, our method works under no small-signal assumption nor photodetection calibration, and eliminates the limits of electrical driving amplitude and operating wavelength. Moreover, it decreases by at least half bandwidth requirement for the photodetector and spectrum analyzer. Our experimental demonstra-tion shows that the measured half-wave voltages of the electrooptic phase modulator obtained by our method agree well with the data measured by the optical spectrum method, and the two-tone heterodyning method greatly improves the measurement range and frequency resolution. The proposed measurement method provides a very simple analysis method for the microwave characterization of high-speed electrooptic phase modulators, which is also a reference for other optoelectronic devices.
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