重离子轰击Ta靶引起的多电离效应
Multiple ionization effect of Ta induced by heavy ions
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摘要: 在兰州重离子加速器国家实验室分别测量了H+,He2+,Ar11+和Xe20+离子轰击Ta表面过程中辐射的X射线谱,并得到了Ta特征X射线谱中Mγ(M3N5)和Mαβ(M4,5N6,7)线的强度,即Ⅰγ和Ⅰαβ.分析结果表明,强度比值Ⅰγ/Ⅰαβ随着入射离子原子序数的增加而显著增加,这是由于碰撞过程中Ta原子的多电离效应使M3支壳层的荧光产额ω3产生了显著增强.Abstract: The M X-ray spectra of Ta induced by H+, He2+, Ar11+ and Xe20+ are measured in Heavy Ion Research Facility in Lanzhou. The intensities of Mγ (M3N5) and Mαβ (M4,5N6,7), i.e. Ⅰγ and Ⅰαβ, are also derived from the spectra. It is found that the intensity ratio of Ⅰγ/Ⅰαβ, increases with the increase of projectile atomic number. The results show that the M3-subshell fluorescence yield ω3 of Ta target is greatly enhanced, owing to multiple ionization effect in collision with heavy ions.
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