Ar（＋17）和Ar（＋16）谱线的电子碰撞展宽

物理学报

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段斌, 吴泽清, 颜君, 李月明, 王建国. 2012: Ar（＋17）和Ar（＋16）谱线的电子碰撞展宽, 物理学报, 61(4): 133-137.

引用本文:

段斌, 吴泽清, 颜君, 李月明, 王建国. 2012: Ar（＋17）和Ar（＋16）谱线的电子碰撞展宽, 物理学报, 61(4): 133-137.

2012: Electron broadening of the resonance lines of Ar＋ 17 and Ar＋ 16, Acta Physica Sinica, 61(4): 133-137.

Citation:

2012: Electron broadening of the resonance lines of Ar＋ 17 and Ar＋ 16, Acta Physica Sinica, 61(4): 133-137.

Electron broadening of the resonance lines of Ar＋ 17 and Ar＋ 16

摘要: 利用修改后伦敦理工大学的UCL扭曲波程序,本文计算了自由电子与原子或离子的碰撞反应矩阵,以此得到它的散射矩阵和碰撞强度.利用碰撞强度,研究电子碰撞对辐射谱线影响.具体地,以Ar~（＋17）和Ar~（＋16）的α线和β线为例,计算了不同电子温度和密度下谱线的展宽和位移.
- 反应矩阵 /
- 碰撞强度 /
- 碰撞展宽
Abstract: With the revised UCL wave code, the reactance matrix can be calculated when an electron impacts on an ion, so that the scattering matrix and the collision strength are calculated. With the collision strength, the electron broadening of the resonance line is studied. Specifically, the widths and the shifts of resonance lines emitted from Ar＋17 and Ar＋16 are calculated under the different values of electron temperature and electron density.