超薄Fe(4(A))膜磁特性极化中子反射研究
Magnetic properties of ultrathin (4 (A))Fe film studied by polarized neutron reflectometry
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摘要: 利用分子束外延薄膜生长技术,制备了200 (A)V/4 (A) Fe/900 V/MgO(100)薄膜样品,通过X射线反射和极化中子反射两种测量手段获得了薄膜的表面、界面及各层膜厚的相关结构信息.中子反射结果表明,Fe原子磁矩在室温下约为1.0±0.1μB,随着温度的降低,Fe原子磁矩增加,在10 K时达到1.5±0.1μB.利用指数定律拟合磁矩随温度的变化情况,外推得出4(A)铁薄膜样品的居里温度约为310±30 K.Abstract: Uhrathin Fe film 200 (A)V/4 (A)Fe/900 (A)V/MgO(100) has been prepared by molecular beam epitaxy (MBE). The structure parameters, such as the surface and interface roughness and the thickness of each layer, were obtained by X-ray and neutron reflectivity measurement. The magnetic properties of the thin Fe layer were investigated by polarized neutron reflectometry at different temperature. The result shows that the magnetic moment of an Fe atom is about 1.0 ± 0.1 μB at room temperature and increases to 1.5 ±0.1 μBat 10 K. The Curie temperature of the thin Fe film is estimated to be 310 ± 30 K.
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