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Figure 1.  (a) Schematic diagram of the experimental device. (b) Magnified view of the region within the dashed-line box in panel (a). (c) Network diagram of heat flow paths.

Figure 2.  Roughness and surface flatness obtained by scanning the surface of the optical-glass sample in three directions with an optical microscope.

Figure 3.  (a) Distribution of polystyrene particles on the sample under a 100× optical microscope. Panels (b) and (c) respectively show the particle consistency in the sampling inspection of polystyrene spheres under an electron microscope.

Figure 4.  Experimental measurement of near-field thermal radiation between optical glass samples. (a) Number of polystyrene particles is approximately 500. (b) Number of polystyrene particles is approximately 750.

Figure 5.  Heat flux varying with the different thicknesses of SiC film on the hot side.

Figure 6.  Experimental measurement of near-field thermal radiation between SiC film–SiO₂: (a) 50 nm SiC–SiO₂, (b) 100 nm SiC–SiO₂ and (c) measured radiative heat flux at different thicknesses of SiC film versus temperature differences.

Figure 7.  Spectral energy diagrams when the temperature of the hot side and the cold side are 310 K and 290 K, respectively, and the vacuum gap is 1 μm.

Figure 8.  Transmission coefficient versus angular frequency and dimensionless wavevector. (a) 50 nm SiC–SiO₂, (b) 1 μm SiC–SiO₂ and (c) 10 μm SiC–SiO₂.