[1] |
邢宏娜, 高文莉, 常帅, 等. 小尺寸纳米颗粒的SEM高分辨成像模式探究——以Ni2P为例[J]. 真空科学与技术学报,2024,44(8):695−703 (in Chinese)
Xing H N, Gao W L, Chang S, et al. Exploration of SEM high-resolution imaging modes for small-sized nanoparticles—taking Ni2P as an example[J]. Chinese Journal of Vacuum Science and Technology,2024,44(8):695−703
|
[2] |
苏慧明, 郭飞飞, 李本寅, 等. 纺织钢领用类金刚石涂层的高温摩擦性能分析[J]. 真空科学与技术学报,2024,44(1):94−100 (in Chinese)
Su H M, Guo F F, Li B Y, et al. Study on high temperature tribological properties of diamond-like coatings used in textile steel collar[J]. Chinese Journal of Vacuum Science and Technology,2024,44(1):94−100
|
[3] |
孙闯, 黄昊, 于文华, 等. 溅射功率对LiCoO2薄膜结构及性能的影响研究[J]. 真空科学与技术学报,2022,42(5):357−363 (in Chinese)
Sun C, Huang H, Yu W H et al. The effects of sputtering power on the structure and properties of LiCoO2 thin films[J]. Chinese Journal of Vacuum Science and Technology,2022,42(5):357−363
|
[4] |
阮涛, 李琼, 马彤梅, 等. 场发射扫描电镜对几种特殊样品形貌的影响[J]. 实验技术与管理,2020,37(2):50−53 (in Chinese)
Ruan T, Li Q, Ma T M, et al. Effect of field emission scanning electron microscopy conditions on the morphology of several special samples[J]. Experimental Technology and Management,2020,37(2):50−53
|
[5] |
吉元, 张虹, 史佳新, 等. 非导电样品荷电效应的吸收电流评价方法[J]. 电子显微学报,2004,23(3):265−268 (in Chinese) doi: 10.3969/j.issn.1000-6281.2004.03.016
Ji Y, Zhang H, Shi J X, et al. Evaluation of charging effect on the non-conductive specimens by absorb current measurement[J]. Journal of Chinese Electron Microscopy Society,2004,23(3):265−268 doi: 10.3969/j.issn.1000-6281.2004.03.016
|
[6] |
汪雨轩, 任天星, 于洪杨, 等. 基于同轴电子全息定量表征水环境中Pd颗粒的荷电效应[J]. 电子显微学报,2021,40(4):379−383 (in Chinese) doi: 10.3969/j.issn.1000-6281.2021.04.004
Wang Y X, Ren T X, Yu H Y, et al. Characterization of charging effect of Pd particles in liquid environment by in-line electron holography[J]. Journal of Chinese Electron Microscopy Society,2021,40(4):379−383 doi: 10.3969/j.issn.1000-6281.2021.04.004
|
[7] |
华佳捷, 刘紫薇, 林初城, 等. 场发射扫描电镜中荷电现象研究[J]. 电子显微学报,2014,33(3):226−232 (in Chinese) doi: 10.3969/j.1000-6281.2014.03.006
Hua J J, Liu Z W, Lin C C, et al. Investigation on charging for field emission scanning electron microscope[J]. Journal of Chinese Electron Microscopy Society,2014,33(3):226−232 doi: 10.3969/j.1000-6281.2014.03.006
|
[8] |
李梅晔. 镀膜对FE-SEM纳米尺度形貌观察的影响[J]. 分析测试技术与仪器,2008,14(2):120−124 (in Chinese) doi: 10.3969/j.issn.1006-3757.2008.02.012
Li M Y. Influence of coating on the micro topography of sample observed with FE SEM[J]. Analysis and Testing Technology and Instruments,2008,14(2):120−124 doi: 10.3969/j.issn.1006-3757.2008.02.012
|
[9] |
万鹏, 王馨楠, 徐强, 等. 材料表面性质对扫描电镜镀膜形貌的影响[J]. 电子显微学报,2021,40(6):758−763 (in Chinese) doi: 10.3969/j.issn.1000-6281.2021.06.018
Wan P, Wang X N, Xu Q, et al. The effects of the nature of the materials surface on the morphology of sputtered coating for SEM sample preparation[J]. Journal of Chinese Electron Microscopy Society,2021,40(6):758−763 doi: 10.3969/j.issn.1000-6281.2021.06.018
|
[10] |
潘桂玲. 扫描电镜样品制备的优化[J]. 电子显微学报,2021,40(4):473−478 (in Chinese) doi: 10.3969/j.issn.1000-6281.2021.04.018
Pan G L. Optimizing sample preparation of scanning electron microscope[J]. Journal of Chinese Electron Microscopy Society,2021,40(4):473−478 doi: 10.3969/j.issn.1000-6281.2021.04.018
|
[11] |
孙千, 高尚, 黄梦诗, 等. 纳米分体高分辨成像的荷电效应与应对策略[J]. 中国粉体技术,2022,28(4):70−78 (in Chinese)
Sun Q, Gao S, Huang M S, et al. Charge effect of high resolution imaging of nano-powders and its countermeasures[J]. China Powder Science and Technology,2022,28(4):70−78
|
[12] |
高翔, 朱紫瑞, 孙伟, 等. 场发射扫描电镜荷电现象的研究及参数优化[J]. 真空科学与技术学报,2018,38(11):1008−1012 (in Chinese)
Gao X, Zhu Z R, Sun W, et al. Solutions to charge accumulation on low conductivity surfaces in imaging with scanning electron microscopy[J]. Chinese Journal of Vacuum Science and Technology,2018,38(11):1008−1012
|
[13] |
周莹, 王虎, 吴伟, 等. 二次电子探测器选择对FESEM图像的影响[J]. 实验室研究与探索,2012,31(7):246−248 (in Chinese)
Zhou Y, Wang H, Wu W, et al. Impact of different secondary electron detectors on FESEM images[J]. Research and Exploration in Laboratory,2012,31(7):246−248
|
[14] |
高尚, 马清, 孙千, 等. 热场发射扫描电镜中的复合物镜和镜筒内探测系统[J]. 测试技术学报,2023,37(5):400−407 (in Chinese) doi: 10.3969/j.issn.1671-7449.2023.05.006
Gao S, Ma Q, Sun Q, et al. Exploration of compound lens and in-column detector systems in Schottky emission scanning electron microscope[J]. Journal of Test and Measurement Technology,2023,37(5):400−407 doi: 10.3969/j.issn.1671-7449.2023.05.006
|
[15] |
Zhang X M, Cen X, Ravichandran R, et al. Simultaneous scanning electron microscope imaging of topographical and chemical contrast using In-lens, In-Column, and Everhart-Thornley detector systems[J]. Microscopy and Microanalysis,2016,1(3):565−575
|