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2012 Volume 29 Issue 7
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R. Ertu(g)Tul, A. Tataro(g)lu. 2012: Influence of Temperature and Frequency on Dielectric Permittivity and ac Conductivity of Au/SnO2/n-Si (MOS) Structures, Chinese Physics Letters, 29(7): 230-234. doi: 10.1088/0256-307X/29/7/077304
Citation: R. Ertu(g)Tul, A. Tataro(g)lu. 2012: Influence of Temperature and Frequency on Dielectric Permittivity and ac Conductivity of Au/SnO2/n-Si (MOS) Structures, Chinese Physics Letters, 29(7): 230-234. doi: 10.1088/0256-307X/29/7/077304
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Influence of Temperature and Frequency on Dielectric Permittivity and ac Conductivity of Au/SnO2/n-Si (MOS) Structures

  • Department of Physics, Faculty of Sciences, Gazi University, 06500, Teknikokullar, Ankara, Turkey

  • Available Online: 30/12/2012
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通讯作者: 陈斌, bchen63@163.com
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Influence of Temperature and Frequency on Dielectric Permittivity and ac Conductivity of Au/SnO2/n-Si (MOS) Structures

  • Available Online: 30/12/2012

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