2014 Volume 31 Issue 2
Article Contents

LIU Qi-Ya, FANG Ze-Bo, JI Ting, LIU Shi-Yan, TAN Yong-Sheng, CHEN Jia-Jun, ZHU Yan-Yan. 2014: Band Alignment and Band Gap Characterization of La2O3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering, Chinese Physics Letters, 31(2): 122-125. doi: 10.1088/0256-307X/31/2/027702
Citation: LIU Qi-Ya, FANG Ze-Bo, JI Ting, LIU Shi-Yan, TAN Yong-Sheng, CHEN Jia-Jun, ZHU Yan-Yan. 2014: Band Alignment and Band Gap Characterization of La2O3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering, Chinese Physics Letters, 31(2): 122-125. doi: 10.1088/0256-307X/31/2/027702

Band Alignment and Band Gap Characterization of La2O3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering

  • Available Online: 30/12/2014
  • Fund Project: the National Natural Science Foundation of China under Grant Nos 51272159,11004130 and 11204202,the Natural Science Foundation of Zhejiang Province under Grant Nos Y6100596 and LQ13A040004,and the Shanghai Educational Commission under Grant No 12zz175
  • 加载中
  • 加载中
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Article Metrics

Article views(94) PDF downloads(0) Cited by(0)

Access History

Band Alignment and Band Gap Characterization of La2O3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering

Abstract: 

Reference (0)

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return