2001 Volume 18 Issue 4
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SHI Yue-Jiang, WAN Bao-Nian. 2001: Energy Resolution Effects on Plasma Electron Temperature Measurements bySoft X-Ray Pulse-Height-Analysis, Chinese Physics Letters, 18(4): 562-563.
Citation: SHI Yue-Jiang, WAN Bao-Nian. 2001: Energy Resolution Effects on Plasma Electron Temperature Measurements bySoft X-Ray Pulse-Height-Analysis, Chinese Physics Letters, 18(4): 562-563.

Energy Resolution Effects on Plasma Electron Temperature Measurements bySoft X-Ray Pulse-Height-Analysis

  • Available Online: 30/04/2001
  • The soft x-ray pulse-height-analysis technique is a conventional tool to measure electron temperature on tokamaks.The soft x-ray spectra distortion due to the energy resolution of the detector will affect the temperature andimpurity concentration determination. To evaluate these effects, distorted spectra as functions of energy resolutionare derived by numerical modelling. The results show that the low-energy resolution detector can fit for the largesized tokamak soft x-ray spectra.
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Energy Resolution Effects on Plasma Electron Temperature Measurements bySoft X-Ray Pulse-Height-Analysis

Abstract: The soft x-ray pulse-height-analysis technique is a conventional tool to measure electron temperature on tokamaks.The soft x-ray spectra distortion due to the energy resolution of the detector will affect the temperature andimpurity concentration determination. To evaluate these effects, distorted spectra as functions of energy resolutionare derived by numerical modelling. The results show that the low-energy resolution detector can fit for the largesized tokamak soft x-ray spectra.

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