高分辨电子显微学的新进展 --走向亚埃电子显微时代
Recent developments in high-resolution electron microscopy--Sub-Angstrom electron microscopy era in sight
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引用本文: | 李建奇. 2006: 高分辨电子显微学的新进展 --走向亚埃电子显微时代, 物理, 35(2): 147-150. doi: 10.3321/j.issn:0379-4148.2006.02.010 |
Citation: | LI Jian-Qi. 2006: Recent developments in high-resolution electron microscopy--Sub-Angstrom electron microscopy era in sight, Physics, 35(2): 147-150. doi: 10.3321/j.issn:0379-4148.2006.02.010 |