用横场伊辛模型研究应力对铁电薄膜的热力学性质的影响
Impact of stress on the thermodynamic properties of ferroelectric films within the Transverse Ising model
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引用本文: | 陶永梅, 蒋青, 曹海霞. 2005: 用横场伊辛模型研究应力对铁电薄膜的热力学性质的影响, 物理学报, 54(1): 274-279. doi: 10.3321/j.issn:1000-3290.2005.01.050 |
Citation: | 2005: Impact of stress on the thermodynamic properties of ferroelectric films within the Transverse Ising model, Acta Physica Sinica, 54(1): 274-279. doi: 10.3321/j.issn:1000-3290.2005.01.050 |