背光阴影成像技术表征ICF靶丸内表面粗糙度
Characterization of inner surface roughness for ICF capsules by backlit shadowgraphy
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| 引用本文: | 刘元琼, 赵学森, 雷海乐, 谢端, 高党忠. 2010: 背光阴影成像技术表征ICF靶丸内表面粗糙度, 强激光与粒子束, 22(12): 2880-2884. doi: 10.3788/HPLPB20102212.2880 |
| Citation: | Liu Yuanqiong, Zhao Xuesen, Lei Haile, Xie Duan, Gao Dangzhong. 2010: Characterization of inner surface roughness for ICF capsules by backlit shadowgraphy, High Power Lase and Particle Beams, 22(12): 2880-2884. doi: 10.3788/HPLPB20102212.2880 |